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Conference Agenda

Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).

Only Sessions at Date / Time

Session Overview

Session

AMT2_Computer-aided Process Control

Time:

Thursday, 12/Sept/2024:

11:00am - 12:15pm

Session Chair: Erik Jung, Fraunhofer IZM

Location: MOA 4

MOA 4

Presentations

11:00am - 11:25am

Advancements in Epoxy Pattern Quality Checks: Harnessing Artificial Intelligence for Enhanced Low-Contrast Analysis

Guodong Zeng, Farnaz Forooghifar, Andreas Wiedmer, Ernst Barmettler, Norbert Ackerl

Besi Switzerland AG, Steinhausen, Switzerland

11:25am - 11:50am

Dicing Lane Quality Quantification & Wafer Assessment Using Image Thresholding Techniques

Damien Jon Leech, Akito Hiro, Geert Schoofs, Bensu Tunca Altintas, Alain Phommahaxay, Koen Kennes, Gerald Beyer, Eric Beyne

imec, Belgium

11:50am - 12:15pm

AI Deep-Learning Approach for Manufacturing Optimization During Chiplets and Heterogeneous Package Inspection

Shahab Chitchian, SeungYeol Kim, TaeYoung Jung, TaeYong Lee, ByeongGweon Joo

INTEKPLUS Co., Daejeon, Korea, Republic of (South Korea)

IEEE ESTC 2024

September 11–13, 2024 | Berlin, Germany

Conference Agenda