11:00am - 12:15pm |
MIP5_Microstructural Properties of Materials for Interconnects Location: MOA 10-12 Chair: Kay Essig, ASE Group
11:00am - 11:25am
Effect of Electromigration on Micro Tensile Test Mechanical Properties and Micro Structure of Pure Copper
Chih-Yu Wang, Kwang-Lung Lin
11:25am - 11:50am
Thermal-Mechanical Analysis of Electroplated Copper for IC Packaging
Abdellah Salahouelhadj, Kris Vanstreels, Joke De Messemaeker, Carine Gerets, John Slabbekoorn, Zaid El-Mekki, Punith Kumar Mudigere Krishne Gowda, Mario Gonzalez, Eric Beyne
11:50am - 12:15pm
Study of Intermetallic Compound Evolution of Pure Sn and SnAg Alloy Solder on Single and Multi-layer Under-bump Materials
Tassawar Hussain, Jaber Derakhshandeh, Tom Cochet, Eric Beyne, Jack Hsu, Dongming He, Ingrid De Wolf
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AP8_Fan Out Reliability Aspects Location: MOA 5 Chair: Grace O'Malley, INEMI
11:00am - 11:25am
Power Delivery for AI/HPC Microprocessors
Mark Li, Vikas Gupta
11:25am - 11:50am
Reliability and RF Performance Assessment of Heterogeneous Integrated FO-WLP Test Structure Packages for Mixed RF Digital Front-End Application
Jesse C. Riedl, Vincent Bortolussi, Christophe Chang, Didier Floriot, Jonathan Leroy, Romain Mathieu, Julien Perraud, Hermann Stieglauer, Gregory Uren, Benoit Lambert
11:50am - 12:15pm
No Warpage and Fast Cure: UV-molding for FOWLP/FOPLP
Markus Schindler, Severin Ringelstetter, Martin Bues, Tobias Königer, Kilian Kreul
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AMT5_Advanced Materials and Processes Location: MOA 4 Chair: Attila Géczy, Budapest University of Technology and Economics
11:00am - 11:25am
Thin Substrate Bonding
Partia Naghibi
11:25am - 11:50am
System-in-package Building block Development for Future Space Equipment
Hélène Jochem, Hugo Garcia, Norbert Venet, Mirko Rocci, Lucas Sollecchia, Paolo Scalmati, Monique Mayr, Carlo Tuninetti, Giovanni Cucinella, Kim Ankeraa, Poul Juul
11:50am - 12:15pm
Single Die Process Using Shadow Masks for a 55µm Fine Pitch Array of 4µm-tall Indium Bumps Across an Entire Chip
Andreas Schneider, Aswathi Koorikkat, Navid Ghorbanian, Toby G. Brookes, John D. Lipp, David Burt, Marcus J. French
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Flex2_Formation of a Conductive Interconnection for Flexible Electronics Location: MOA 3 Chair: Jukka Hast, VTT Technical Research Centre of Finland ltd.
11:00am - 11:25am
Additively Manufactured Flexible Electronics with Selectively Soldered Surface-mounted Devices Utilising StarJet Technology
Daniel Straubinger, Zeba Khan, Peter Koltay, Roland Zengerle, Sabrina Kartmann, Zhe Shu
11:25am - 11:50am
Electroless Nickel/Immersion Gold and Immersion Tin as Final Finish Solutions for Flexible Substrates in EV Batteries
Britta Schafsteller, Mario Rosin, Michael Schwaemmlein, Boris Kraft, Hubertus Mertens, Jasemin Tuerkelly, Sandra Nelle
11:50am - 12:15pm
Electrical Characterization of an ALPIDE Chip TAB Bonded with Flexible PCBs
David Novel, Alessandro Lega, Tiziano Facchinelli, Roberto Iuppa, Stefania Beolé, Pierluigi Bellutti
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Rel3_Progress in Failure Analytical and Material Testing Methods Location: MOA 1+2 Chair: Matthias Petzold, Fraunhofer IMWS
11:00am - 11:25am
Full-field IR-Thermography for Bond-quality Inspection of Electroplated Aluminium Interconnects for Cryo-SiP Architectures
Bernhard Wunderle, Daniel May, Imants Cirulis, Silvia Braun, Uwe Zschenderlein, Jens Heilmann, Remi Pantou, Ralph Schacht, Mohamad Abo Ras
11:25am - 11:50am
Using µ-RAMAN Spectroscopy to Inspect Sintered Interconnects
Gordon Elger, E Liu, Fabian Steinberger, Bernhard Wunderle, Zubair Mohd
11:50am - 12:15pm
Determination of Mechanical Properties for Copper in Plated Through Holes by Combination of Tensile Test and Nanoindentation
Janine Conrad, Olaf Wittler, Martin Schneider-Ramelow
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